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Organizer
Special Sessions
Special Session 1
Title: Design and Test Needs for Adaptive, Self-Learning and Cognitive Systems
Abstract: The era of Intelligent Systems will benefit from billions of smart sensor nodes connected to the Cloud. Such Internet-of Thing (IoT) Sensor Nodes will perform variety of tasks including sensing, in-sensor analytics, communication to/from the Cloud, actuation based on feedback from Cloud etc. In this data-driven IoT revolution, workloads, operating conditions and computational/communication demands on distributed and connected devices will undergo ultra-large dynamic ranges of several orders of magnitude while being energy limited (battery operated or energy harvested). On the other hand, energy-efficient computation on such complex many-dimensional data calls for brain-inspired cognitive computing. This special-session will present recent advances of such adaptive, self-learning and cognitive systems, highlighting design challenges and test needs for each to motivate future testing research in these emerging technologies. Each talk will go into adaptive IoT Sensor Node, Self-learning Systems and Cognitive Computing, respectively. The first talk will highlight the challenges and opportunities of data acquisition in IoT nodes and focus on intelligent sensors and highlight advances in adaptive communication to support widely varying IoT data loads. The second talk will discuss the design and test challenges for self-learning systems. The final talk will enlighten the emerging design paradigm of cognitive computing and highlight the test needs for such paradigm shifting intelligent computing technologies.
Organizer: Shreyas SEN, Purdue University – USA
Moderator: Shreyas SEN, Purdue University – USA
Presentations and speakers:
Energy-efficient Cognitive Computing
Kaushik ROY, Purdue University – USA
Design and Test Needs for Adaptive IoT Sensor Nodes
Shreyas SEN*, Arijit RAYCHOWDHURY╪, *Purdue University – USA, ╪Georgia Institute of Technology – USA
Self-Learning Systems: Opportunities and Challenges
Abhijit CHATTERJEE, Georgia Institute of Technology – USA
Special Session 2
Title: Testing for Automotive: What Are the Needs and What Are the Solutions?
Abstract: ISO 26262 defines requirements and recommendations for different levels of automotive safety integrity (ASIL); it addresses the what, but not necessarily the how. What testing strategy is required may be related to the safety criticality of the end application. What is required from IP providers, to semiconductor suppliers, to the product supplier with regard to test? What does the end product supplier require of the semiconductor supplier and IP provider?
Organizer: Teresa MCLAURIN, ARM – USA
Moderator: Hans MANHAEVE, Ridgetop Europe – Belgium
Presentations and speakers:
ISO 26262 Fault Detection and Testing, What’s Required?
Mathieu BLAZY-WINNING, NXP – France
The Challenges of Test for Automotive Applications - An IP Provider’s Perspective
Pete HARROD, ARM – United Kingdom
Automotive Expectation for Semiconductor Testability
Viktor MUELLER, Continental – Germany
Functional Safety Requirements and Solutions for Automotive SoCs
Gurgen HARUTYUNYAN, Synopsys - Armenia
Special Session 3
Title: Big Data for Test Engineering: Opportunities and Challenges
Abstract: Smaller technologies create major challenges when it comes to yield learning, time-to-market, quality, reliability, etc. How can big data help in this? What are the opportunities that big data can offer for the semiconductor industry? Is this already in place? What are the major challenges preventing the deployment of big data for test?
Organizer: Said HAMDIOUI, TU Delft – The Netherlands
Moderator: Said HAMDIOUI, TU Delft – The Netherlands
Presentations and speakers:
Big Data Yield Learning Aspects
Thomas HERRMANN, GLOBALFOUNDRIES – Germany
Using Big Data to Enable Part-level Prediction in the Supply Chain
Abel MIKATI, Qualtera – France
Big Data for Test Engineering
Keith ARNOLD, PDF Solutions – USA
